12. december 2016
Simulated Aided Testing/Simulation Guided Testing (SAT/SGT)
There are many standards on environmental conditions and how to simulate and accelerate these conditions in Durability-Reliability demonstrations testing, especially for Electrical/Electronic (E/E) products.
This webinar will provide an over view of SAT/SGT analysis method with examples of how to apply the technique to accelerated thermal cycling life testing of electronic products.
Thursday the 15th of December, 11:00 AM or 2:00 PM CEST