Double pulse testing is a standard procedure for designers to learn about the switching behavior of power devices. To facilitate the testing of drive options for the 1200 V CoolSiC™ MOSFET in TO247 3-pin and 4-pin packages, Infineon Technologies AG (FSE: IFX / OTCQX: IFNNY) introduced a modular evaluation platform.
Its center comprises a motherboard with interchangeable drive cards. The drive options include a Miller clamp and a bipolar supply card; additional variants will be launched in the near future. In shortening time-to market for a variety of applications, this portfolio will help paving the way for silicon carbide to become mainstream.
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