Auditoriet i Instituttet for Energiteknologi, Aalborg Universitet, Pontoppidanstræde 111, 9220 Aalborg Øst, vil 13. juni være vært for Aalborg Universitets Centre of Reliable Power Electronics 7. årlige symposium, hvor ingeniører, forskere, brancheeksperter og folk med interesse for pålidelighed af effektelektronik mødes og udveksler viden og erfaringer.
Flere internationalt anerkendte key-notes fra forskning og industri vil præsentere deres synspunkter inden for effektelektronikkens påligelihed.
Efter præsentationerne om forskningsresultater og fremskridt fra blandt andre CORPE vil der være en diskussion om den strategiske roadmap. Der vil også være en poster-session med forskere fra CORPE.
Symposiet er gratis for deltager (der er dog en no-show fee ved udeblivelse). Man kan tilmelde sig eventen her.
Registering, venligst, senest 31. maj, 2019.
Info/Kontakt: Francesco Iannuzzo, fia@et.aau.dk
Nick Baker, nba@et.aau.dk
Programme:
08:00 – 09:00 Coffee, Networking and Registration
09:00 – 09:10 Welcome and a short introduction to CORPE
Centre Leader Frede Blaabjerg, Professor, Aalborg University
09:10 – 09:45 “Health and Condition Monitoring: an Industrial Perspective”
Stefan Mollov, Head of R&D, Energy&Environment, Mitsubishi, France
09:45 – 10:20 “Power Modules Packaging: Technology and Cost Breakdown”
Elena Barbarini, SystemPlus/Yole Développement, France
10:20 – 10:35 Coffee break
10:35 – 11:10 “Reliability Testing at Vishay Semiconductor”
Marcello Turnaturi, R&D Director, Vishay Semiconductor, Italy
11:10 – 11:45 “Ultra-Reliable Packaging for SiC Modules”
Michael Tønnes, R&D Director, Danfoss Silicon Power, Germany
11:45 – 12:20 “Reliability Challenges in Motor Drives”
Garron Morris, Principal Engineer, Rockwell Automation, USA
12:30 – 13:30 Lunch and Poster Session 13:30 – 15:15 – CORPE Presentations
13:30 – 13:45 “CORPE-initiated projects: APETT and REPEPS”
Huai Wang, Associate Professor
13:45 – 14:00 “Thin-Film Sensors for Power Modules”
Nick Baker, Post Doc
14:00 – 14:15 “Design for Reliability of PV-Battery Systems”
Ariya Sangwongwanich, Post Doc
14:15 – 14:30 “Reliability Assessment in Power Electronic Based Systems”
Saeed Peyghami, Post Doc
14:30 – 14:45 “Lifetime Estimation of DC Link Capacitors in Adj. Speed Drives”
Haoran Wang, Post Doc
14:45 – 15:00 “Materials issues in GaN on Si for power devices”
Kjeld Pedersen, Professor
15:00 – 15:15 “WBG Packaging for Low-Medium Voltage and HF Applications”
Stig Munk-Nielsen, Professor
15:15 – 15:30 CORPE Overview + New Grand Initiatives: X-Power
Francesco Iannuzzo, Professor
15:30 – 17:00 Visit to CORPE Test Facilities
Poster Session:
“LEGO-Block Analysis for Accelerated Life Test Profile Generation”
Martin Fogsgaard, Research Assistant
“Design for Reliability and Robustness (DfR2) – The next generation reliability tool for power electronics”
Ionut Vernica, Research Assistant
“Impact of the Case Temperature on the Reliability of SiC MOSFETs Under Repetitive Short Circuit Tests”
He Du, PhD Student
“Framework for Lifetime and Reliability Assessment of Residential PV-Battery Systems”
Monika Sandelic, Research Assistant
“Parameter Identification of DC-DC Power Converters Based on Dynamic Characteristics”
Yingzhou Peng, PhD Student
“First Observations in Degradation Testing of Planar Magnetics”
Zhan Shen, PhD Student
“TBC”
Zhijian Yin, PhD Student
“TBC”
Zhongxu Wang, PhD Student
“System-level reliability evaluation of the modular multilevel converter”
Yi Zhang, PhD Student